DIGITAL CIRCUIT TESTING AND TESTABILITY BY PARAG K LALA PDF

Parag K. Lala digital circuits, logic circuit testing, VLSI, fault detection, design- for-testability, chapter also discusses test generation for sequential circuits. Digital circuit testing and testability by Parag K. Lala, , Academic Press edition, in English. Get this from a library! Digital circuit testing and testability. [Parag K Lala].

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Return to Book Page. Reliability is one of the most important considerations in computer design, and an important part of creating a computer is designing one that is tolerant of faults.

This text reviews many different techniques and methodologies to show how to design systems that are fault tolerant. It presents coverage of self checking logic design at the gate and the transistor level; dis Reliability is one of the most important considerations in computer design, and an important part of creating a computer is designing one that is parqg of faults.

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It presents coverage of self checking logic design at the gate and the transistor level; discusses the latest techniques for testing state machines; and includes detailed coverage of memory testing.

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Digital Circuit Testing and Testability

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